Characterization and modeling of laser-induced single-event...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Characterization and modeling of laser-induced single-event burn-out in SiC power diodes

Mbaye, N., Pouget, V., Darracq, F., Lewis, D.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.113
Date:
September, 2013
File:
PDF, 931 KB
english, 2013
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