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Direct observation of the generation of breakdown spots in MIM structures under constant voltage stress
Saura, X., Moix, D., Suñé, J., Hurley, P.K., Miranda, E.Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.063
Date:
September, 2013
File:
PDF, 1.09 MB
english, 2013