A low-cost built-in error correction circuit design for STT-MRAM reliability improvement
Kang, Wang, Zhao, WeiSheng, Wang, Zhaohao, Zhang, Yue, Klein, Jacques-Olivier, Zhang, Youguang, Chappert, Claude, Ravelosona, DafinéVolume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.036
Date:
September, 2013
File:
PDF, 944 KB
english, 2013