Electrical modeling of the photoelectric effect induced by...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell

Sarafianos, A., Roscian, C., Dutertre, J.-M., Lisart, M., Tria, A.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.125
Date:
September, 2013
File:
PDF, 1.86 MB
english, 2013
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