Distributed electro-thermal model of IGBT chip –...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Distributed electro-thermal model of IGBT chip – Application to top-metal ageing effects in short circuit conditions

Moussodji, J., Kociniewski, T., Khatir, Z.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.089
Date:
September, 2013
File:
PDF, 1.61 MB
english, 2013
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