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“Hot-plugging” of LED modules: Electrical characterization and device degradation
Dal Lago, M., Meneghini, M., Trivellin, N., Mura, G., Vanzi, M., Meneghesso, G., Zanoni, E.Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.054
Date:
September, 2013
File:
PDF, 2.32 MB
english, 2013