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Corner induced non-uniform electric field effect on the electrical reliability of metal–oxide–semiconductor devices with non-planar substrates
Tseng, Po-Hao, Hwu, Jenn-GwoVolume:
91
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.10.009
Date:
January, 2014
File:
PDF, 2.04 MB
english, 2014