A nonlinear degradation path dependent end-of-life...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

A nonlinear degradation path dependent end-of-life estimation framework from noisy observations

Cucu Laurenciu, N., Cotofana, S.D.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.058
Date:
September, 2013
File:
PDF, 564 KB
english, 2013
Conversion to is in progress
Conversion to is failed