Free-charge carrier parameters of n-type, p-type and...

Thin Solid Films 2014 / 11 Vol. 571

Free-charge carrier parameters of n-type, p-type and compensated InN:Mg determined by infrared spectroscopic ellipsometry

Schöche, S., Hofmann, T., Darakchieva, V., Wang, X., Yoshikawa, A., Wang, K., Araki, T., Nanishi, Y., Schubert, M.
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Volume:
571
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.01.051
Date:
November, 2014
File:
PDF, 542 KB
english, 2014
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