Volume 571

Thin Solid Films

Volume 571

1

Characterization of highly anisotropic three-dimensionally nanostructured surfaces

Schmidt, Daniel

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 806 KB

english, 2014

2

Characterization of μc-Si:H/a-Si:H tandem solar cell structures by spectroscopic ellipsometry

Murata, Daisuke, Yuguchi, Tetsuya, Fujiwara, Hiroyuki

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.86 MB

english, 2014

3

Symmetries and relationships between elements of the Mueller matrix spectra of the cuticle of the beetle Cotinis mutabilis

Muñoz-Pineda, E., Järrendahl, K., Arwin, H., Mendoza-Galván, A.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.33 MB

english, 2014

4

Infrared to vacuum-ultraviolet ellipsometry studies of spinel (MgAl2O4)

Zollner, Christian J., Willett-Gies, Travis I., Zollner, Stefan, Choi, Sukgeun

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 889 KB

english, 2014

5

Visualization of the interaction between tris and lysozyme with a biosensor based on total internal reflection imaging ellipsometry

Kang, Tengfei, Niu, Yu, Jin, Gang

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 678 KB

english, 2014

6

On-line monitoring of solar cell module production by ellipsometry technique

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.45 MB

english, 2014

7

Optical properties of CuCdTeO thin films sputtered from CdTe-CuO composite targets

Mendoza-Galván, A., Arreola-Jardón, G., Karlsson, L.H., Persson, P.O.Å., Jiménez-Sandoval, S.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.25 MB

english, 2014

8

Size effects in the mechanical response of nanoscale multilayer coatings on glass

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1012 KB

english, 2014

9

Infrared ellipsometry for improved laterally resolved analysis of thin films

Hinrichs, Karsten, Furchner, Andreas, Sun, Guoguang, Gensch, Michael, Rappich, Jörg, Oates, Thomas W.H.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 959 KB

english, 2014

10

Optical Mueller matrix modeling of chiral AlxIn1−xN nanospirals

Magnusson, Roger, Birch, Jens, Sandström, Per, Hsiao, Ching-Lien, Arwin, Hans, Järrendahl, Kenneth

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.76 MB

english, 2014

11

An extended Drude model for the in-situ spectroscopic ellipsometry analysis of ZnO thin layers and surface modifications

Fricke, Lennart, Böntgen, Tammo, Lorbeer, Jan, Bundesmann, Carsten, Schmidt-Grund, Rüdiger, Grundmann, Marius

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 388 KB

english, 2014

12

Compositional dependence of the optical conductivity of Ni1−xPtx alloys (0

Abdallah, Lina S., Zollner, Stefan, Lavoie, Christian, Ozcan, Ahmet, Raymond, Mark

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 735 KB

english, 2014

13

Dielectric function of zinc oxide thin films in a broad spectral range

Mammadov, E., Naghavi, N., Jehl, Z., Renou, G., Tiwald, T., Mamedov, N., Lincot, D., Guillemoles, J.-F.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 542 KB

english, 2014

14

Approach for extracting complex dielectric function spectra in weakly-absorbing regions

Karki Gautam, L., Haneef, H., Junda, M.M., Saint John, D.B., Podraza, N.J.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 671 KB

english, 2014

15

Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration

Lohner, T., Agócs, E., Petrik, P., Zolnai, Z., Szilágyi, E., Kovács, I., Szőkefalvi-Nagy, Z., Tóth, L., Tóth, A.L., Illés, L., Bársony, I.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.34 MB

english, 2014

16

Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer

Niese, Sven, Krüger, Peter, Kubec, Adam, Laas, Roman, Gawlitza, Peter, Melzer, Kathleen, Braun, Stefan, Zschech, Ehrenfried

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 617 KB

english, 2014

17

In and out of incidence plane Mueller matrix scattering ellipsometry of rough mc-Si

Maria, Jérôme, Aas, Lars Martin Sandvik, Kildemo, Morten

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.05 MB

english, 2014

18

Design of a real-time spectroscopic rotating compensator ellipsometer without systematic errors

Broch, Laurent, Stein, Nicolas, Zimmer, Alexandre, Battie, Yann, Naciri, Aotmane En

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 820 KB

english, 2014

19

Optical characterization of patterned thin films

Rosu, D., Petrik, P., Rattmann, G., Schellenberger, M., Beck, U., Hertwig, A.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.19 MB

english, 2014

20

Optical and magneto-optical characterization of thin films of functionalized tetraphenylporphyrins

Lungwitz, F., Mende, C., Fronk, M., Haidu, F., Lang, H., Salvan, G., Zahn, D.R.T.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1013 KB

english, 2014

21

In situ study of ligand–receptor interaction by total internal reflection ellipsometry

Balevicius, Z., Baleviciute, I., Tumenas, S., Tamosaitis, L., Stirke, A., Makaraviciute, A., Ramanaviciene, A., Ramanavicius, A.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 765 KB

english, 2014

22

Optical properties of epitaxial (Ba0.39Sr0.61)6Ti2Nb8O30 thin films grown by pulsed laser deposition

Zhang, Y.L., Yang, S.H., Teng, D.D.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 650 KB

english, 2014

23

Improved combination of scalar diffraction theory and Rayleigh–Rice theory and its application to spectroscopic ellipsometry of randomly rough surfaces

Ohlídal, Ivan, Franta, Daniel, Nečas, David

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 480 KB

english, 2014

24

Assessment of mechanical properties of metallic thin-films through micro-beam testing

Trueba, M., Gonzalez, D., Elizalde, M.R., Martínez-Esnaola, J.M., Hernandez, M.T., Li, H., Pantuso, D., Ocaña, I.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 921 KB

english, 2014

25

Assessment of non-uniform thin films using spectroscopic ellipsometry and imaging spectroscopic reflectometry

Nečas, David, Ohlídal, Ivan, Franta, Daniel, Čudek, Vladimír, Ohlídal, Miloslav, Vodák, Jiří, Sládková, Lucia, Zajíčková, Lenka, Eliáš, Marek, Vižďa, František

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 811 KB

english, 2014

26

Vibrational properties of bulk LaAlO3 from Fourier-transform infrared ellipsometry

Willett-Gies, Travis, DeLong, Eric, Zollner, Stefan

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 930 KB

english, 2014

27

Free-charge carrier parameters of n-type, p-type and compensated InN:Mg determined by infrared spectroscopic ellipsometry

Schöche, S., Hofmann, T., Darakchieva, V., Wang, X., Yoshikawa, A., Wang, K., Araki, T., Nanishi, Y., Schubert, M.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 542 KB

english, 2014

28

The dielectric tensor of monoclinic α-3,4,9,10-perylene tetracarboxylic dianhydride in the visible spectral range

Alonso, M.I., Garriga, M., Ossó, J.O., Schreiber, F., Scholz, R.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 617 KB

english, 2014

29

Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics

Koirala, Prakash, Attygalle, Dinesh, Aryal, Puruswottam, Pradhan, Puja, Chen, Jie, Marsillac, Sylvain, Ferlauto, Andre S., Podraza, Nikolas J., Collins, Robert W.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.49 MB

english, 2014

30

Utilization of the sum rule for construction of advanced dispersion model of crystalline silicon containing interstitial oxygen

Franta, Daniel, Nečas, David, Zajíčková, Lenka, Ohlídal, Ivan

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 584 KB

english, 2014

31

Combined direct- and reciprocal-space approach for converting spectra to energy scales with negligible loss of information

Aspnes, D.E., Choi, S.G.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 927 KB

english, 2014

32

Vacuum ultraviolet ellipsometer using inclined detector as analyzer to measure stokes parameters and optical constants — With results for AlN optical constants

Saito, T., Ozaki, K., Fukui, K., Iwai, H., Yamamoto, K., Miyake, H., Hiramatsu, K.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 629 KB

english, 2014

33

Importance of Mueller matrix characterization of bianisotropic metamaterials

Guth, N., Varault, S., Grand, J., Guida, G., Bonod, N., Gallas, B., Rivory, J.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.14 MB

english, 2014

34

Spectroscopic ellipsometry — Past, present, and future

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.03 MB

english, 2014

35

Optical indices of switchable mirrors based on Mg–Y alloy thin films in the transparent state

Yamada, Y., Miura, M., Tajima, K., Okada, M., Tazawa, M., Yoshimura, K.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 393 KB

english, 2014

36

Broadening of dielectric response and sum rule conservation

Franta, Daniel, Nečas, David, Zajíčková, Lenka, Ohlídal, Ivan

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 574 KB

english, 2014

37

A liquid crystal variable retarder-based reflectance difference spectrometer for fast, high precision spectroscopic measurements

Hu, Chunguang, Xie, Pengfei, Huo, Shuchun, Li, Yanning, Hu, Xiaotang

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.63 MB

english, 2014

38

Surface roughness and optical contact characterization of transparent prisms using frustrated total internal reflection tunneling ellipsometry

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 637 KB

english, 2014

39

On the complex refractive index of polymer:fullerene photovoltaic blends

Campoy-Quiles, M., Müller, C., Garriga, M., Wang, E., Inganäs, O., Alonso, M.I.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.45 MB

english, 2014

40

Optical properties of hydrated tungsten trioxide 3WO3·H2O

Valyukh, I., Jiao, Z., Arwin, H., Sun, X.W.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.28 MB

english, 2014

41

Optical metrology of thick photoresist process for advanced 3D applications

Nolot, E., André, A., Scibetta, C., Poulingue, M., Levin, L., Vignoud, L., Isselé, H.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 977 KB

english, 2014

42

Useful Mueller matrix symmetries for ellipsometry

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.04 MB

english, 2014

43

The effects of Mn doping on the optical properties of chemically deposited BiFeO3 thin films

Yan, N., Zhang, Y.L., Tang, W.L., Yang, S.H., Chen, D.H.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 364 KB

english, 2014

44

Dynamic analysis of DNA nanoparticle immobilization to model biomaterial substrates using combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation

Kasputis, Tadas, Pieper, Alex, Schubert, Mathias, Pannier, Angela K.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.14 MB

english, 2014

45

In situ ellipsometry — A powerful tool for monitoring alkali doping of organic thin films

Haidu, F., Ludemann, M., Schäfer, P., Gordan, O.D., Zahn, D.R.T.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 642 KB

english, 2014

46

Development of a compact polarization analysis apparatus for plasma soft X-ray laser

Imazono, Takashi, Koike, Masato

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 597 KB

english, 2014

47

Ellipsometry of monolayers of metallic nanoparticles taking into account depolarization

Bortchagovsky, E.G., Mishakova, T.O., Hingerl, K.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.27 MB

english, 2014

48

Spectroscopic ellipsometry analysis of perovskite manganite films for resistance switching devices

Yamada, Masaki, Sakai, Osamu, Nakamura, Toshihiro

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 537 KB

english, 2014

49

Optical diffractometry of anisotropic holographic structure composed of liquid crystal and polymer phases with extended Bragg modes

Kakiuchida, H., Tazawa, M., Yoshimura, K., Ogiwara, A.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.12 MB

english, 2014

50

Ellipsometric analysis of silicon surfaces textured by ns and sub-ps KrF laser pulses

Toth, Z., Hanyecz, I., Gárdián, A., Budai, J., Csontos, J., Pápa, Z., Füle, M.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.26 MB

english, 2014

51

Surface plasmon resonance combined with spectroscopic ellipsometry read-out for probing surface–biomolecule interaction

Giangregorio, Maria M., Bianco, Giuseppe V., Capezzuto, Pio, Bruno, Giovanni, Losurdo, Maria

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 789 KB

english, 2014

52

Joint detection of tumor markers with imaging ellipsometry biosensor

Niu, Yu, Kang, Tengfei, Jin, Gang

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.08 MB

english, 2014

53

Design, optimization and realization of a ferroelectric liquid crystal based Mueller matrix ellipsometer using a genetic algorithm

Aas, Lars Martin S., Skåre, Daniel G., Ellingsen, Pål G., Letnes, Paul Anton, Kildemo, Morten

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.36 MB

english, 2014

54

A sensitive bithiophene-based biosensor for interferon-gamma characterization and analysis

Tsai, P.I., Lee, S.S., Chou, S.T., Jan, C.M., Chang, Y.T., Lee, A.S.Y., Lee, C.K.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 949 KB

english, 2014

55

Spectroscopic ellipsometry studies of sol-gel-derived Cu-doped ZnO thin films

Yang, Shenghong, Zhang, Yueli, Mo, Dang

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 899 KB

english, 2014

56

Combining surface X-ray scattering and ellipsometry for non-destructive characterization of ion beam-induced GaSb surface nanostructures

Høydalsvik, Kristin, Aas, Lars Martin S., Døli, Ellen, Søndergård, Elin, Kildemo, Morten, Breiby, Dag Werner

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.35 MB

english, 2014

57

Study of annealing effects upon the optical and electrical properties of SnO2:F/SiCxOy low emissivity coatings by spectroscopic ellipsometry

Wang, Kangkai, Cheng, Bo, Wu, Bin, Defranoux, Christophe, Basa, Peter, Song, Chenlu, Han, Gaorong, Liu, Yong

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 989 KB

english, 2014

58

Dielectric function spectra and inter-band optical transitions in TlGaS2

Kawabata, Toshiyuki, Shim, YongGu, Wakita, Kazuki, Mamedov, Nazim

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.18 MB

english, 2014

59

Temperature dependence of the optical properties of Ba0.75Sr0.25TiO3 thin films

Železný, V., Chvostová, D., Pajasová, L., Jelínek, M., Kocourek, T., Daniš, S., Valvoda, V.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 530 KB

english, 2014

60

Polarization modulation polarimeter for measuring two-dimensional distribution of five cell parameters of a twisted nematic liquid crystal display

Chang, Yu-Hsin, Yu, Chih-Jen, Hsu, Kuei-Chu, Ho, Chien-Wa, Chang, Sheng-Yi, Chou, Chien

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 762 KB

english, 2014

61

Resolving lateral and vertical structures by ellipsometry using wavelength range scan

Petrik, P., Agocs, E., Volk, J., Lukacs, I., Fodor, B., Kozma, P., Lohner, T., Oh, S., Wakayama, Y., Nagata, T., Fried, M.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 631 KB

english, 2014

62

Contact damage and fracture micromechanisms of multilayered TiN/CrN coatings at micro- and nano-length scales

Roa, J.J., Jiménez-Piqué, E., Martínez, R., Ramírez, G., Tarragó, J.M., Rodríguez, R., Llanes, L.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.33 MB

english, 2014

63

Confinement in single walled carbon nanotubes investigated by spectroscopic ellipsometry

Battie, Y., Jamon, D., Lauret, J.S., Gu, Q., Gicquel-Guézo, M., En Naciri, A., Loiseau, A.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.14 MB

english, 2014

64

In vitro characterization of optical property of mouse myoblast cells by spectroscopic ellipsometry

Yang, S.M., Choi, S.J., Kim, H.S., Kim, S.Y.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 904 KB

english, 2014

65

Polarizing properties and structural characteristics of the cuticle of the scarab Beetle Chrysina gloriosa

Fernández del Río, Lía, Arwin, Hans, Järrendahl, Kenneth

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.61 MB

english, 2014

66

Strain rate sensitivity and related plastic deformation mechanism transition in nanoscale Ag/W multilayers

Zhou, Q., Wang, F., Huang, P., Xu, K.W.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.17 MB

english, 2014

67

Depolarization correction method for ellipsometric measurements of large grain size zinc-oxide films

Pápa, Z., Budai, J., Hanyecz, I., Csontos, J., Toth, Z.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 865 KB

english, 2014

68

On the development of Finite-Difference Time-Domain for modeling the spectroscopic ellipsometry response of 1D periodic structures

Foo, Yishu, Cheung, King Tai, To, Chap Hang, Zapien, Juan Antonio

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.91 MB

english, 2014

69

Ductile film delamination from compliant substrates using hard overlayers

Cordill, M.J., Marx, V.M., Kirchlechner, C.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 963 KB

english, 2014

70

Characterization of in-depth cavity distribution after thermal annealing of helium-implanted silicon and gallium nitride

Fodor, B., Cayrel, F., Agocs, E., Alquier, D., Fried, M., Petrik, P.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.02 MB

english, 2014

71

Temperature dependent dielectric function and reflectivity spectra of nonpolar wurtzite AlN

Feneberg, Martin, Romero, María Fátima, Neuschl, Benjamin, Thonke, Klaus, Röppischer, Marcus, Cobet, Christoph, Esser, Norbert, Bickermann, Matthias, Goldhahn, Rüdiger

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 481 KB

english, 2014

72

Optical characterization by variable angle spectroscopic ellipsometry of nitrogen-doped MgxZn1−xO thin films prepared by the plasma-assisted reactive evaporation method

Abe, Takami, Nakagawa, Akira, Nakagawa, Michiko, Chiba, Tetsuya, Takahashi, Shuzo, Kashiwaba, Yasuhiro, Chiba, Shigeki, Ojima, Tsutomu, Aota, Katsumi, Daibo, Masahiro, Osada, Hiroshi, Fujiwara, Tamiya

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.03 MB

english, 2014

73

Ionic liquid structure at the electrified ionic liquid|Hg interface studied using in situ spectroscopic ellipsometry

Nishi, Naoya, Uchiyashiki, Junya, Oogami, Ryo, Sakka, Tetsuo

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 382 KB

english, 2014

74

How spectroscopic ellipsometry can aid graphene technology?

Losurdo, Maria, Giangregorio, Maria M., Bianco, Giuseppe V., Capezzuto, Pio, Bruno, Giovanni

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 914 KB

english, 2014

75

Flash-lamp annealing of ZnO-layers on copper–indium–gallium–sulphide layers: A spectroscopic ellipsometry study

Reck, J., Seeger, S., Weise, M., Mientus, R., Schulte, J., Ellmer, K.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 934 KB

english, 2014

76

ZnO based transparent conductive oxide films with controlled type of conduction

Zaharescu, M., Mihaiu, S., Toader, A., Atkinson, I., Calderon-Moreno, J., Anastasescu, M., Nicolescu, M., Duta, M., Gartner, M., Vojisavljevic, K., Malic, B., Ivanov, V.A., Zaretskaya, E.P.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.57 MB

english, 2014

77

Comparison and analysis of Mueller-matrix spectra from exoskeletons of blue, green and red Cetonia aurata

Arwin, H., Fernández del Río, L., Järrendahl, K.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.24 MB

english, 2014

78

Formulation of error propagation and estimation in grating reconstruction by a dual-rotating compensator Mueller matrix polarimeter

Chen, Xiuguo, Liu, Shiyuan, Gu, Honggang, Zhang, Chuanwei

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 792 KB

english, 2014

79

Transmission ellipsometry of anisotropic substrates and thin films at oblique incidence. Handling multiple reflections

Arteaga, Oriol, Freudenthal, John, Nichols, Shane, Canillas, Adolf, Kahr, Bart

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 368 KB

english, 2014

80

Temperature dependence of the electronic gaps of semiconductors

Cardona, M., Kremer, R.K.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 442 KB

english, 2014

81

Electrochemical deposition of Cu and Nb from pyrrolidinium based ionic liquid

Mascia, Michele, Vacca, Annalisa, Mais, Laura, Palmas, Simonetta, Musu, Elodia, Delogu, Francesco

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.28 MB

english, 2014

82

In situ imaging ellipsometer using a LiNbO3 electrooptic crystal

Jin, Lianhua, Wakako, Yusuke, Takizawa, Kuniharu, Kondoh, Eiichi

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.45 MB

english, 2014

83

Thermal stability of nanoscale metallic multilayers

Ramos, A.S., Cavaleiro, A.J., Vieira, M.T., Morgiel, J., Safran, G.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.03 MB

english, 2014

84

Microstructure and mechanical properties of physical vapor deposited Cu/W nanoscale multilayers: Influence of layer thickness and temperature

Monclús, M.A., Karlik, M., Callisti, M., Frutos, E., LLorca, J., Polcar, T., Molina-Aldareguía, J.M.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.40 MB

english, 2014

85

Elevated temperature dependence of hardness in tri-metallic nano-scale metallic multilayer systems

Schoeppner, R.L., Abdolrahim, N., Salehinia, I., Zbib, H.M., Bahr, D.F.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.53 MB

english, 2014

86

Optical properties of nitrogen-doped graphene thin films probed by spectroscopic ellipsometry

Shen, C.C., Tseng, C.C., Lin, C.T., Li, L.J., Liu, H.L.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.78 MB

english, 2014

87

Influence of the IR-mirror layer composition in the mechanical properties of solar selective coatings made from Mo:Si3N4 cermet

Álvarez-Fraga, L., Monclús, M.A., Molina-Aldareguía, J.M., Sánchez-García, J.A., Céspedes, E., Escobar-Galindo, R., Prieto, C.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 740 KB

english, 2014

88

Approaches to calculate the dielectric function of ZnO around the band gap

Agocs, E., Fodor, B., Pollakowski, B., Beckhoff, B., Nutsch, A., Jank, M., Petrik, P.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 791 KB

english, 2014

89

Large Verdet constant in the Tb implanted gamma-Fe2O3 films

Lv, Peiwen, Wang, Xian, Huang, Feng, Lin, Zhang

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.77 MB

english, 2014

90

Deposition and characterization of Pt nanocluster films by means of gas aggregation cluster source

Kylián, Ondřej, Prokeš, Jan, Polonskyi, Oleksandr, Čechvala, Juraj, Kousal, Jaroslav, Pešička, Josef, Hanuš, Jan, Biederman, Hynek

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 839 KB

english, 2014

91

Microstructure, electrical resistivity and stresses in sputter deposited W and Mo films and the influence of the interface on bilayer properties

Rane, Gayatri K., Menzel, Siegfried, Gemming, Thomas, Eckert, Jürgen

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.71 MB

english, 2014

92

Distinguishing mechanisms of morphological instabilities in phase change materials during switching

Santala, M.K., Raoux, S., Topuria, T., Reed, B.W., LaGrange, T., Campbell, G.H.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.10 MB

english, 2014

93

Three modes of inkless micro-contact printing: contact printing, edge spreading, and channel stamping

Kim, Ju-Han, Khang, Dahl-Young

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.72 MB

english, 2014

94

Stress transition from compressive to tensile for silicon nanocrystals embedded in amorphous silica matrix

Zatryb, G., Misiewicz, J., Wilson, P.R.J., Wojcik, J., Mascher, P., Podhorodecki, A.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.01 MB

english, 2014

95

Thickness dependent magnetic properties of (111)-oriented Co0.8Fe2.2O4 thin film grown by pulsed laser deposition

Khodaei, M., Seyyed Ebrahimi, S.A., Park, Yong Jun, Choi, Sun Hee, Kim, CheolGi, Son, Junwoo, Baik, Sunggi

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.42 MB

english, 2014

96

Effect of spatial inhomogeneity of charge carrier mobility on current–voltage characteristics in organic field-effect transistors

Sworakowski, Juliusz, Bielecka, Urszula, Lutsyk, Petro, Janus, Krzysztof

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 327 KB

english, 2014

97

Optical characterization of nanocrystalline boron nitride thin films grown by atomic layer deposition

Snure, Michael, Paduano, Qing, Hamilton, Merle, Shoaf, Jodie, Mann, J. Matthew

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 839 KB

english, 2014

98

Comparative study of the radio-frequency magnetron sputter deposited CaP films fabricated onto acid-etched or pulsed electron beam-treated titanium

Surmeneva, M.A., Surmenev, R.A., Tyurin, A.I., Mukhametkaliyev, T.M., Teresov, A.D., Koval, N.N., Pirozhkova, T.S., Shuvarin, I.A., Oehr, C.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 747 KB

english, 2014

99

Surface structure optimization for cost effective field emission of zinc oxide nanorods on glass substrate

Dehghan Nayeri, F., Narimani, K., Kolahdouz, M., Asl-Soleimani, E., Salehi, F.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.40 MB

english, 2014

100

Antibacterial-active multilayer films composed of polyoxometalate and Methyl Violet: Fabrication, characterization and properties

Yu, Xia, Chen, Changyun, Peng, Jun, Shi, Zhenyu, Shen, Yan, Mei, Jilan, Ren, Zixing

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.78 MB

english, 2014

101

Ge surface-energy-driven secondary grain growth via two-step annealing

Lee, Sangsoo, Son, Yong-Hoon, Park, Yongjo, Hwang, Kihyun, Shin, Yoo Gyun, Yoon, Euijoon

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.23 MB

english, 2014

102

Nanostructuration and band gap emission enhancement of ZnO film via electrochemical anodization

Achour, A., Soussou, M.A., Ait Aissa, K., Islam, M., Barreau, N., Faulques, E., Le Brizoual, L., Djouadi, M.A., Boujtita, M.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 851 KB

english, 2014

103

Influence of Ti top electrode thickness on the resistive switching properties of forming free and self-rectified TiO2−x thin films

Bousoulas, P., Michelakaki, I., Tsoukalas, D.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.07 MB

english, 2014

104

Electron-beam induced surface relief shape inversion in amorphous Ge4As4Se92 thin films

Bilanych, V., Komanicky, V., Feher, A., Kuzma, V., Rizak, V.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 667 KB

english, 2014

105

Crystallization kinetics of Se–Te thin films

Svoboda, Roman, Gutwirth, Jan, Málek, Jiří, Wágner, Tomáš

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.17 MB

english, 2014

106

Spectroelectrochemical and morphological studies of the ageing of silver nanoparticles embedded in ultra-thin perfluorinated sputter deposited films

Ebbert, C., Alissawi, N., Somsen, C., Eggeler, G., Strunskus, T., Faupel, F., Grundmeier, G.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 3.24 MB

english, 2014

107

Rapid and highly efficient growth of graphene on copper by chemical vapor deposition of ethanol

Lisi, Nicola, Buonocore, Francesco, Dikonimos, Theodoros, Leoni, Enrico, Faggio, Giuliana, Messina, Giacomo, Morandi, Vittorio, Ortolani, Luca, Capasso, Andrea

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.51 MB

english, 2014

108

Tin nitride thin films fabricated by reactive radio frequency magnetron sputtering at various nitrogen gas ratios

Choi, Sujin, Kang, Jisoo, Park, Juyun, Kang, Yong-Cheol

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.23 MB

english, 2014

109

Layer-by-layer assembled TiO2 films with high ultraviolet light-shielding property

Li, Xiaozhou, Wang, Lin, Pei, Yuxin, Jiang, Jinqiang

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.01 MB

english, 2014

110

Morphological differences in transparent conductive indium-doped zinc oxide thin films deposited by ultrasonic spray pyrolysis

Jongthammanurak, Samerkhae, Cheawkul, Tinnaphob, Witana, Maetapa

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.10 MB

english, 2014

111

Pulsed laser deposition of La0.6Ca0.4Fe0.8Ni0.2O3−δ thin films on SrTiO3: Preparation, characterization and electrical properties

Sohrabi, P., Daneshmandi, S., Salamati, H., Ranjbar, M.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.92 MB

english, 2014

112

Preparation of thin films of perovskite-type YAlO3:Gd3+–Pr3+ UV phosphors

Shimizu, Yuhei, Ueda, Kazushige, Massuyeau, Florian, Jobic, Stéphane

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 777 KB

english, 2014

113

Impact of capillarity forces on the steady-state self-organization in the thin chromium film on glass under laser irradiation

Gedvilas, Mindaugas, Voisiat, Bogdan, Regelskis, Kęstutis, Račiukaitis, Gediminas

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.46 MB

english, 2014

114

Effect of thermal annealing on the performance of WO3–Ag–WO3 transparent conductive film

Lin, Boning, Lan, Changyong, Li, Chun, Chen, Zexiang

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.79 MB

english, 2014

115

Effects of atomic ordering on the elastic properties of TiN- and VN-based ternary alloys

Edström, D., Sangiovanni, D.G., Hultman, L., Chirita, V.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.54 MB

english, 2014

116

Al–Ni–Y–X (X=Cu, Ta, Zr) metallic glass composite thin films for broad-band uniform reflectivity

Chang, C.M., Wang, C.H., Hsu, J.H., Huang, J.C.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 978 KB

english, 2014

117

Hydrogen, oxygen and hydroxyl on porous silicon surface: A joint density-functional perturbation theory and infrared spectroscopy approach

Alfaro, Pedro, Palavicini, Alessio, Wang, Chumin

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 950 KB

english, 2014

118

Roll-to-roll compatible organic thin film transistor manufacturing technique by printing, lamination, and laser ablation

Hassinen, Tomi, Ruotsalainen, Teemu, Laakso, Petri, Penttilä, Raimo, Sandberg, Henrik G.O.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.73 MB

english, 2014

119

Spectroscopic ellipsometry characterization of nano-crystalline diamond films prepared at various substrate temperatures and pulsed plasma frequencies using microwave plasma enhanced chemical vapor deposition apparatus with linear antenna delivery

Mistrik, J., Janicek, P., Taylor, A., Fendrych, F., Fekete, L., Jager, A., Nesladek, M.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.64 MB

english, 2014

120

Fabrication and characterization of pedestal optical waveguides using TeO2–WO3–Bi2O3 thin film as core layer

Camilo, M.E., Kassab, L.R.P., Assumpção, T.A.A., Cacho, V.D.D., Alayo, M.I.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.13 MB

english, 2014

121

Improving the uncommon (110) growing orientation of Al-doped ZnO thin films through sequential pulsed laser deposition

Coman, Tudor, Ursu, Elena Laura, Nica, Valentin, Tiron, Vasile, Olaru, Mihaela, Cotofana, Corneliu, Dobromir, Marius, Coroaba, Adina, Dragos, Oana-Georgiana, Lupu, Nicoleta, Caltun, Ovidiu Florin, Urs

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.67 MB

english, 2014

122

A taper angle control technique using thin-film layer stiction phenomenon

Kim, Youngseok, Heo, Eunah, Lee, Hojin

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 2.52 MB

english, 2014

123

Variation of the nanostructural feature of nc-SiC:H thin films with post-deposition thermal annealing

Sen, Chan-Dany, Son, Jong-Ick, Kim, Hyo-Han, Yun, Han-Sol, Cho, Nam-Hee

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.20 MB

english, 2014

124

Editorial Board

Journal:

Thin Solid Films

Year:

2014

File:

PDF, 53 KB

2014

125

Effect of layer thickness on the high temperature mechanical properties of Al/SiC nanolaminates

Lotfian, S., Mayer, C., Chawla, N., Llorca, J., Misra, A., Baldwin, J.K., Molina-Aldareguía, J.M.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 1.63 MB

english, 2014

126

ICSE VI Preface

Otani, Yukitoshi, Tazawa, Masato, Kawabata, Shuichi

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 117 KB

english, 2014

127

Mechanical behavior of nanoscale multilayers

Molina-Aldareguia, Jon M., Martín-Bragado, Ignacio, Llorca, Javier

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 119 KB

english, 2014

128

In-situ spectroscopic ellipsometry of microcrystalline silicon deposited by plasma-enhanced chemical vapor deposition on flexible Fe–Ni alloy substrate for photovoltaic applications

Mrázková, Z., Torres-Rios, A., Ruggeri, R., Foldyna, M., Postava, K., Pištora, J., Roca i Cabarrocas, P.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 878 KB

english, 2014

129

The effect of process parameters on the structure, photocatalytic and self-cleaning properties of TiO2 and Ag-TiO2 coatings deposited using reactive magnetron sputtering

Navabpour, P., Ostovarpour, S., Hampshire, J., Kelly, P., Verran, J., Cooke, K.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 4.23 MB

english, 2014

130

Flexible n-i-p thin film silicon solar cells on polyimide foils with textured ZnO:Ga back reflector

Marins, E., Warzecha, M., Michard, S., Hotovy, J., Böttler, W., Alpuim, P., Finger, F.

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 712 KB

english, 2014

131

Evaluation of niobium dimethylamino-ethoxide for chemical vapour deposition of niobium oxide thin films

Dabirian, Ali, Kuzminykh, Yury, Wagner, Estelle, Benvenuti, Giacomo, Rushworth, Simon, Hoffmann, Patrik

Journal:

Thin Solid Films

Year:

2014

Language:

english

File:

PDF, 592 KB

english, 2014

132

Editorial Board

Journal:

Thin Solid Films

Year:

2014

File:

PDF, 53 KB

2014

133

Editorial Board

Journal:

Thin Solid Films

Year:

2014

File:

PDF, 50 KB

2014

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Tor version

Z-Library

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски