![](/img/cover-not-exists.png)
Design issues of a thin-film p-channel SOI power MOSFET for high-temperature applications
Yoshimura, Masayuki, Uchida, Atsushi, Matsumoto, SatoshiVolume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.078
Date:
September, 2013
File:
PDF, 1.75 MB
english, 2013