Electrical characterization under mechanical stress at...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach

Baccar, F., Azzopardi, S., Theolier, L., El Boubkari, K., Deletage, J-Y., Woirgard, E.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.076
Date:
September, 2013
File:
PDF, 1.09 MB
english, 2013
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