Conclusion of the accelerated stress conditions affecting...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Conclusion of the accelerated stress conditions affecting phosphor-converted LEDs using the fractional factorial design method

Yoon, Y.G., Kang, J.H., Jang, I.H., Chan, S.I., Jang, J.S.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.070
Date:
September, 2013
File:
PDF, 1.35 MB
english, 2013
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