BIST architecture for oscillation test of analog ICs and...

Microelectronics Reliability 2014 / 05 Vol. 54; Iss. 5

BIST architecture for oscillation test of analog ICs and investigation of test hardware influence

Arbet, D., Stopjaková, V., Brenkuš, J., Gyepes, G., Kováč, M., Majer, L.
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.12.027
Date:
May, 2014
File:
PDF, 1.11 MB
english, 2014
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