Dynamic Near-Field Scanning Thermal Microscopy on thin...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Dynamic Near-Field Scanning Thermal Microscopy on thin films

Heiderhoff, R., Li, H., Riedl, T.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.006
Date:
September, 2013
File:
PDF, 850 KB
english, 2013
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