Thermal cycling impacts on supercapacitor performances...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Thermal cycling impacts on supercapacitor performances during calendar ageing

Ayadi, M., Briat, O., Eddahech, A., German, R., Coquery, G., Vinassa, J.M.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.079
Date:
September, 2013
File:
PDF, 544 KB
english, 2013
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