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Field failure mechanism and reproduction due to moisture for low-voltage ZnO varistors
Jeong, Jae-SeongVolume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.080
Date:
September, 2013
File:
PDF, 2.80 MB
english, 2013