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The role of the optical trans-characteristics in laser diode analysis
Mura, G., Vanzi, M., Marcello, G., Cao, R.Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.114
Date:
September, 2013
File:
PDF, 953 KB
english, 2013