Temperature-dependent reverse-bias stress of normally-off...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Temperature-dependent reverse-bias stress of normally-off GaN power FETs

Giuliani, F., Delmonte, N., Cova, P., Menozzi, R.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.068
Date:
September, 2013
File:
PDF, 1.75 MB
english, 2013
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