Field-effect control of breakdown paths in HfO2 based MIM...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Field-effect control of breakdown paths in HfO2 based MIM structures

Saura, X., Lian, X., Jiménez, D., Miranda, E., Borrisé, X., Campabadal, F., Suñé, J.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.061
Date:
September, 2013
File:
PDF, 1.31 MB
english, 2013
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