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In situ ellipsometry — A powerful tool for monitoring alkali doping of organic thin films
Haidu, F., Ludemann, M., Schäfer, P., Gordan, O.D., Zahn, D.R.T.Volume:
571
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.02.101
Date:
November, 2014
File:
PDF, 642 KB
english, 2014