Spectroscopic ellipsometry analysis of perovskite manganite...

Thin Solid Films 2014 / 11 Vol. 571

Spectroscopic ellipsometry analysis of perovskite manganite films for resistance switching devices

Yamada, Masaki, Sakai, Osamu, Nakamura, Toshihiro
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Volume:
571
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2013.11.145
Date:
November, 2014
File:
PDF, 537 KB
english, 2014
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