A dynamic synchronization method to realize soft defect...

Microelectronics Reliability 2014 / 05 Vol. 54; Iss. 5

A dynamic synchronization method to realize soft defect localization applied on digital and mixed-mode analog ICs in failure analysis

Wu, Chunlei, Yao, Suying
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Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.01.021
Date:
May, 2014
File:
PDF, 3.02 MB
english, 2014
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