A novel test structure for OxRRAM process variability...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

A novel test structure for OxRRAM process variability evaluation

Aziza, H., Bocquet, M., Portal, J.-M., Moreau, M., Muller, C.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.012
Date:
September, 2013
File:
PDF, 1.72 MB
english, 2013
Conversion to is in progress
Conversion to is failed