2MeV electron irradiation effects on the electrical...

2MeV electron irradiation effects on the electrical characteristics of MOS capacitors with ALD Al2O3 dielectrics of different thickness

Rafí, J.M., González, M.B., Takakura, K., Tsunoda, I., Yoneoka, M., Beldarrain, O., Zabala, M., Campabadal, F.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.023
Date:
September, 2013
File:
PDF, 1.18 MB
english, 2013
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