Experimental analysis of electro-thermal instability in SiC...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Experimental analysis of electro-thermal instability in SiC Power MOSFETs

Riccio, M., Castellazzi, A., De Falco, G., Irace, A.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.014
Date:
September, 2013
File:
PDF, 2.14 MB
english, 2013
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