Detectability of automotive power MOSFET on-resistance...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion

Weber, Y., Goxe, J., Castignolles, M.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.055
Date:
September, 2013
File:
PDF, 1.51 MB
english, 2013
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