Reliability of power MOSFET-based smart switches under...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24V battery system applications

Rostaing, G., Berkani, M., Mechouche, D., Labrousse, D., Lefebvre, S., Khatir, Z., Dupuy, Ph.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.120
Date:
September, 2013
File:
PDF, 1.00 MB
english, 2013
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