Dynamic simulation of octahedron slotted metal structures
Kludt, J., Weide-Zaage, K., Ackermann, M., Hein, V.Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.059
Date:
September, 2013
File:
PDF, 2.59 MB
english, 2013