Characterization of MIS structures and PTFTs using TiOx...

Microelectronics Reliability 2014 / 05 Vol. 54; Iss. 5

Characterization of MIS structures and PTFTs using TiOx deposited by spin-coating

Meneses, C., Sanchez, J.G., Estrada, M., Cerdeira, A., Pallarés, J., Iñiguez, B., Marsal, L.F.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
54
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2014.01.020
Date:
May, 2014
File:
PDF, 692 KB
english, 2014
Conversion to is in progress
Conversion to is failed