Building-up of system level ESD modeling: Impact of a...

Microelectronics Reliability 2013 / 2 Vol. 53; Iss. 2

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation

Monnereau, N., Caignet, F., Trémouilles, D., Nolhier, N., Bafleur, M.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2012.04.012
Date:
February, 2013
File:
PDF, 1.53 MB
english, 2013
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