An investigation of the interface state density in...

Solid-State Electronics 1980 Vol. 23; Iss. 3

An investigation of the interface state density in metal-silicon nitride-silicon structures

J.P. Bigorgne, M. Favre, G. Salace, J. Despujols
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Volume:
23
Year:
1980
Language:
english
Pages:
5
DOI:
10.1016/0038-1101(80)90009-x
File:
PDF, 428 KB
english, 1980
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