Dependence of MOSFET noise parameters in n-channel MOSFETs...

Solid-State Electronics 1982 Vol. 25; Iss. 4

Dependence of MOSFET noise parameters in n-channel MOSFETs on oxide thickness

H.S. Park, A. van der Ziel
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Volume:
25
Year:
1982
Language:
english
Pages:
3
DOI:
10.1016/0038-1101(82)90140-x
File:
PDF, 198 KB
english, 1982
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