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Characterization of reverse recovery transient behavior of bipolar transistors for emitter parameters determination
J.J. Liou, H.K. Brown, M.S. ClammeVolume:
31
Year:
1988
Language:
english
Pages:
7
DOI:
10.1016/0038-1101(88)90006-8
File:
PDF, 572 KB
english, 1988