Modeling and parameter extraction technique from the...

Modeling and parameter extraction technique from the ramp-voltage stressed I–V characteristics of thermally grown SiO2

G. Slavcheva
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
33
Year:
1990
Language:
english
Pages:
8
DOI:
10.1016/0038-1101(90)90063-k
File:
PDF, 536 KB
english, 1990
Conversion to is in progress
Conversion to is failed