A technique to measure the dynamic response of a-Si:H thin...

A technique to measure the dynamic response of a-Si:H thin film transistor circuits

Rashid Bashir, Gerold W. Neudeck
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Volume:
33
Year:
1990
Language:
english
Pages:
2
DOI:
10.1016/0038-1101(90)90082-p
File:
PDF, 208 KB
english, 1990
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