Low-bias-noise spectroscopy of field-effect transistor...

Solid-State Electronics 1990 Vol. 33; Iss. 8

Low-bias-noise spectroscopy of field-effect transistor channels: Depletion-region trap models and spectra

Robert B. Hallgren
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Volume:
33
Year:
1990
Language:
english
Pages:
9
DOI:
10.1016/0038-1101(90)90222-z
File:
PDF, 889 KB
english, 1990
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