Analysis of the DX traps—Induced transient characteristics...

Solid-State Electronics 1990 Vol. 33; Iss. 8

Analysis of the DX traps—Induced transient characteristics in AlGaAs/GaAs HEMTs

Tahui Wang, Chu-Chiao Yu
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Volume:
33
Year:
1990
Language:
english
Pages:
7
DOI:
10.1016/0038-1101(90)90223-2
File:
PDF, 430 KB
english, 1990
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