![](/img/cover-not-exists.png)
Analysis of I–V measurements on PtSi-Si Schottky structures in a wide temperature range
D. Donoval, M. Barus, M. ZdimalVolume:
34
Year:
1991
Language:
english
Pages:
9
DOI:
10.1016/0038-1101(91)90031-s
File:
PDF, 488 KB
english, 1991