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Experimental study and modeling of band-to-band tunneling leakage current in thin-oxide MOSFETs
I. Nedev, A. Asenov, E. StefanovVolume:
34
Year:
1991
Language:
english
Pages:
8
DOI:
10.1016/0038-1101(91)90036-x
File:
PDF, 739 KB
english, 1991