Effect of oxide resistance on the characterization of...

Solid-State Electronics 1991 Vol. 34; Iss. 12

Effect of oxide resistance on the characterization of interface trap density in MOS structures

Jing-Jenn Lin, Jenn-Gwo Hwu
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Volume:
34
Year:
1991
Language:
english
Pages:
6
DOI:
10.1016/0038-1101(91)90043-x
File:
PDF, 451 KB
english, 1991
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