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Characterization of a defect layer at a Schottky barrier interface by current and capacitance measurements
A. Cola, M.G. Lupo, L. Vasanelli, A. ValentiniVolume:
36
Year:
1993
Language:
english
Pages:
5
DOI:
10.1016/0038-1101(93)90250-t
File:
PDF, 519 KB
english, 1993