Transient analysis of submicron CMOS latchup with a...

Solid-State Electronics 1994 Vol. 37; Iss. 2

Transient analysis of submicron CMOS latchup with a physical criterion

Ming-Dou Ker, Chung-Yu Wu
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Volume:
37
Year:
1994
Language:
english
Pages:
19
DOI:
10.1016/0038-1101(94)90078-7
File:
PDF, 1.13 MB
english, 1994
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