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Degradation of bipolar junction transistors under dynamic high current stress and biased in open-collector condition
Ping-Chen Chang, Sheng-Lyang Jang, Young-Shying ChenVolume:
37
Year:
1994
Language:
english
Pages:
7
DOI:
10.1016/0038-1101(94)90082-5
File:
PDF, 429 KB
english, 1994