A simple trap-detrap model for accurate prediction of radiation induced threshold voltage shifts in radiation tolerant oxides for all static or time variant oxide fields
Derek Kimpton, John KerrVolume:
37
Year:
1994
Language:
english
Pages:
6
DOI:
10.1016/0038-1101(94)90120-1
File:
PDF, 521 KB
english, 1994