Analytical study of the contribution of fast and slow oxide...

Analytical study of the contribution of fast and slow oxide traps to the charge pumping current in MOS structures

D. Bauza, G. Ghibaudo
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Volume:
39
Year:
1996
Language:
english
Pages:
8
DOI:
10.1016/0038-1101(95)00156-5
File:
PDF, 637 KB
english, 1996
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