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Separation of d.c. and a.c. competing effect of polysilicon-gate depletion in deep submicron CMOS circuit performance
Wallace W. Lin, Chunlin LiangVolume:
39
Year:
1996
Language:
english
Pages:
3
DOI:
10.1016/0038-1101(96)00022-6
File:
PDF, 219 KB
english, 1996