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A relationship between interface trap density and transconductance in 6HSiC enhancement mode field-effect transistors
M.W. Dryfuse, M. Tabib-AzarVolume:
39
Year:
1996
Language:
english
Pages:
5
DOI:
10.1016/0038-1101(96)00035-4
File:
PDF, 506 KB
english, 1996