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A nondestructive method for measuring the photoelectric parameters of wafers with p-n junctions
O.G. Koshelev, V.A. MorozovaVolume:
39
Year:
1996
Language:
english
Pages:
5
DOI:
10.1016/0038-1101(96)00040-8
File:
PDF, 438 KB
english, 1996