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Subband splitting and surface roughness induced spin relaxation in (001) silicon SOI MOSFETs
Osintsev, Dmitri, Baumgartner, Oskar, Stanojevic, Zlatan, Sverdlov, Viktor, Selberherr, SiegfriedVolume:
90
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2013.02.055
Date:
December, 2013
File:
PDF, 838 KB
english, 2013